beam (Total 131667 Patents Found)

Beam (131667 Patents Found)
Techniques for maintaining beam pointing for an Electronically Scanned Antenna (ESA) as its frequency is varied over a wide frequency bandwidth. A technique uses discrete phase shifters, a number of stored states, and a control methodology for rapidly switching among the states....
An adjustable diaphragm arrangement, or device, for defining an aperture ch confines a beam of radiation, especially for radiation therapy, in which cup shaped diaphragm elements, the edges of which define the edge of the aperture and which elements are concave toward a common point at or near the source of radiation,...
In an integrated optical arrangement, such as a photoelectric position measuring arrangement, a diffraction grid is scanned by light beam diffraction by a scanning unit having a laser. A light beam bundle emanating from the laser is split by the diffraction grid into two diffraction beam bundles, which are inserted int...
An optical beam is made closer to diffraction limited by coupling it into a multi-mode guide, such as an optical fiber, of sufficient length to generate a stimulated Brillouin scattering (SBS) return beam with improved divergence. For this purpose the term ΔkL is made substantially greater than π, where Δk is the di...
An electromagnetic energy interference seal arrangement is provided for use in light beam touch panel systems. The electromagnetic energy interference seal includes the use of waveguides associated with the light beam sources and detectors to improve light beam touch panel performance. The waveguide size is selected so...
A single beam direct read during write and write protect system for use in an optical data storage system. The optical data storage system includes a reflective-type optical disk, a laser for producing a beam of radiation to write data onto the optical disk during write operations, and a radiation detector for producin...
Method and apparatus for high-power-density beam welding in combination with upset welding. The method comprises forming, along abutting edges of metal materials to be welded, a continuous upset weld line, and subsequently beam welding the metal materials by irradiation by a high-power-density beam along the weld line....
Disclosed are measurement (observation) pads for judging whether or not a dynamic random access memory (DRAM) adopting a shared sense system is functioning as designed. Concretely, measurement pads are formed by the step of forming a second layer of wiring respectively connected to pairs of complementary data lines whi...
A method for controlling the position of an optical beam incident on a track of a rotationally mobile carrier of information, such as a disc, includes picking up a beam reflected by the disc using an optical pick-up and determining a positioning error of the beam with respect to the track. The pick-up may include sever...
An optical apparatus for controlling an angle of divergence of a ring beam which is capable of irradiating a ringed light beam having a uniform distribution of light intensity with an arbitrary angle of divergence with respect to the optical axis in the direction of 360° concurrently. The optical apparatus comprises p...
Method for particle beam testing of substrates for liquid crystal displays (LCD). This is directed to methods wherein, given a substrate (SUB1) for a liquid crystal display, either potentials or, respectively, currents are set in defined fashion with a particle beam (S1, S2 and S4) and/or potentials are measured by det...
A new method for accurately and sequentially growing monolayers and creating new superlattice structures employing a MBE thermal source control technique employing a quasi-double beam atomic absorption background correction measurements with the beam blocked and with the beam unblocked and by calculating the concentrat...
In a front wheel drive vehicle, a rear suspension system is provided for non-driven non-steered rear wheels. A twist beam axle extends along a transverse horizontal line between the rear wheels, and a pair of coil springs extend along respective spaced parallel axes intersecting the noted transverse horizontal line. A ...
A method of performing electron beam lithography on high resistivity substrates including forming semiconductor material on a high resistivity substrate and etching the semiconductor material to form mesas with electrically interconnecting bridges between the mesas. Semiconductor devices are formed in the mesas employi...
This invention relates to electromagnetic wave beam paths, formation of the beam, illumination of programmable electromagnetic wave field vector orientation rotating devices (*PEMFVORD*) with an electromagnetic beam, and the technique of projection of the modulated beam. This invention also relates to a unique light pa...
Petunia explants are irradiated with heavy-ion beams, and the chimeric individuals differentiated from the explants are selected (FSRP method). Then, explants are obtained from the chimeric individuals and subjected to tissue culture, followed by selection of re-differentiated chimeric individuals with stable character...
An aberration corrector has two stages of multipole elements each of which has a thickness along the optical axis. Each multipole element produces a static electric or magnetic field of 3-fold symmetry and a static electromagnetic field of 2- or 3-fold symmetry superimposed on the static electric or magnetic field. In ...
An apparatus for positioning a cuvette in an optical beam path of an optical measuring instrument, with a shaft for axially inserting a cuvette, and means for pressing a cuvette against at least one wall surface of the shaft, which comprise at least one arrangement of a magnet, stationarily arranged with respect to the...
An emitter for an electron-beam projection lithography system includes a photoconductor substrate, an insulating layer formed on a front surface of the photoconductor substrate, a gate electrode layer formed on the insulating layer, and a base electrode layer formed on a rear surface of the photoconductor substrate and...
A dual beam electronically scanned phased array antenna architecture is provided. The architecture includes a plurality of antenna modules substantially orthogonally connected to a signal distribution board. Each module includes a radiator board substantially orthogonally connected to a first end of a support mandrel. ...
Planar, sectorized, millimeter-wave antenna arrays may include one or more of housings of dielectric material, such as split-blocks of a plastic material, having metallized plastic horns and waveguides formed, etched, and/or cut therein, waveguide-to-planar-transmission-line transition devices and planar structures emb...
Flexible retort packaging structures, including retort pouches and methods of making both the packaging structures and pouches, wherein an otherwise conventional flexible retort substrate is surface printed, the printed image is optionally overcoated with a protective overcoating material. The printing is accordingly l...
Disclosed are methods and systems for compensating for process direction banding associated with a document processing system including a ROS. According to one exemplary embodiment, a ROS driver uses a plurality of beam delay/advance values to compensate for banding caused by an interaction of a halftone pattern and pr...
A system for performing nano beam diffraction (NBD) analysis, includes a focused ion beam (FIB) device for preparing a transmission electron microscopy (TEM) sample, a broad beam ion mill for milling the TEM sample to remove a surface portion of the TEM sample, and a strain analyzer for performing NBD analysis on the m...
The charged particle storage system includes: a storage ring circulating, by a perturbating device, charged particles injected from outside; a power source supplying an electric current to the perturbating device; and a charged particle beam generating device. The charged particle beam generating device includes a DC a...
Semiconductor chips with curable out of specification measured values of an anneal-activated parameter are identified at a test step. A plurality of anneal plans are generated to include at least one of the identified semiconductor chips. A net yield improvement is calculated for each anneal plan. Each anneal plan incl...
A method for characterizing a light beam includes separating the light beam by a separator optic into first and second sub-beams; propagating the first and second sub-beams over first and second optics, respectively, said first and second optics being respectively arranged so that the sub-beams on leaving the optics ar...
A system and method provide a dual beam chromatic point sensor (CPS) system operable to simultaneously measure two surface regions. In one embodiment, a single beam CPS optical pen may have a dual beam assembly attached. First and second measurement beams of the system may be positioned on respective first and second s...
A method for the microscopy of samples using optical microscopy and particle beam microscopy provides that the samples are divided into a partial quantity and a residual quantity and the samples of the partial quantity are prepared to contain registration marks. The samples of the partial quantity are imaged using opti...